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1 article(s) from Winkler, Jochen

Comparative electron microscopy particle sizing of TiO₂ pigments: sample preparation and measurement

Ralf Theissmann,
Christopher Drury,
Markus Rohe,
Thomas Koch,
Jochen Winkler and
Petr Pikal

Beilstein J. Nanotechnol. 2024, 15, 317–332, doi:10.3762/bjnano.15.29

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Figure 1: Comparison of cumulative distribution curves measured by three different manufacturers using three ...

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Figure 2: spICP-MS of pre-dispersed (562 J/mL ultrasonic treatment prepared one day before measurement) and s...

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Figure 3: SEM top-view image; in-lens SE detector, resolution: 0.99 nm/pixel, field of view (full image): 2.5...

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Figure 4: TEM image; 2048 × 2048 pixel CCD, resolution: 0.96 nm/pixel, field of view (full image): 2 μm × 2 μ...

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Figure 5: SEM cross-section image; PDBSE detector, resolution: 3.3 nm/pixel, field of view (full image): 8.5 ...

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Figure 6: Comparison of electron microscopy results obtained by the TiO₂ manufacturers (M1–M3) and the extern...

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Figure 7: Comparison of SSA calculated from particle size distribution with SSA measured by BET.

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Figure 8: Relation of measured SSA values and SSA values calculated from EM MinFeret and ECD particle size me...

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Figure 9: CIE L* and CIE b* values of different TiO₂ pigment samples as a function of the D50_n MinFeret diame...

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Published 25 Mar 2024

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Comparative electron microscopy particle sizing of TiO2 pigments: sample preparation and measurement

Comparative electron microscopy particle sizing of TiO₂ pigments: sample preparation and measurement